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Commit 65102e8a authored by CoscineBot's avatar CoscineBot :gear: Committed by Petar Hristov
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Merge request for new application profile ISEA Doppelpulstest

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2 merge requests!384Master,!222Merge request for new application profile ISEA Doppelpulstest
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@base <https://purl.org/coscine/ap/ISEA/Doppelpulstest/>.
@prefix rdf: <http://www.w3.org/1999/02/22-rdf-syntax-ns#>.
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#>.
@prefix xsd: <http://www.w3.org/2001/XMLSchema#>.
@prefix dbo: <http://dbpedia.org/ontology/>.
@prefix dcterms: <http://purl.org/dc/terms/>.
@prefix qb: <http://purl.org/linked-data/cube#>.
@prefix sh: <http://www.w3.org/ns/shacl#>.
@prefix vocabterms: <https://purl.org/coscine/terms/>.
@prefix aps: <https://purl.org/coscine/ap/>.
<https://purl.org/coscine/ap/ISEA/Doppelpulstest/> dcterms:created "2023-04-17"^^xsd:date;
dcterms:creator "Severin Klever";
dcterms:description "Über dieses Applikationsprofil werden Messdaten erfasst, welche Doppelpulstests von Leistungshalbleitern beinhalten."@de,
"This application profile is used to collect measurement data which includes double pulse tests of power semiconductor devices."@en;
dcterms:license "https://spdx.org/licenses/CC-BY-4.0.html";
dcterms:subject "Elektrotechnik"@de,
"Electrical Engineering"@en;
dcterms:title "ISEA Doppelpulstest"@de,
"ISEA Double Pulse Test"@en;
a rdfs:Class,
sh:NodeShape;
sh:closed false;
sh:property [sh:path <http://www.w3id.org/ecsel-dr-AH#device_name> ;
sh:name "Device Under Test (Name)"@de ;
sh:name "Device Under Test (Name)"@en ;
sh:order 1 ;
sh:minCount 1 ;
sh:datatype xsd:string],
[sh:path <http://schema.mobivoc.org/#voltageInV> ;
sh:name "Tested Voltage (V)"@de ;
sh:name "Tested Voltage (V)"@en ;
sh:order 3 ;
sh:minCount 1 ;
sh:datatype xsd:decimal ;
sh:minExclusive 0 ],
[sh:path <http://schema.mobivoc.org/#currentInA> ;
sh:name "Tested Current (A)"@de ;
sh:name "Tested Current (A)"@en ;
sh:order 4 ;
sh:minCount 1 ;
sh:datatype xsd:decimal ;
sh:minExclusive 0 ],
[sh:path <http://www.w3id.org/ecsel-dr-OOSMP#temperature> ;
sh:name "Tested Temperature (°C)"@de ;
sh:name "Tested Temperature (°C)"@en ;
sh:order 4 ;
sh:minCount 1 ;
sh:datatype xsd:decimal ;
sh:minExclusive "-273.15"^^xsd:integer],
[sh:path dbo:date ;
sh:name "Date"@de ;
sh:name "Date"@en ;
sh:order 0 ;
sh:minCount 1 ;
sh:datatype xsd:dateTime],
[sh:path dbo:manufacturer ;
sh:name "Manufacturer"@de ;
sh:name "Manufacturer"@en ;
sh:order 2 ;
sh:minCount 1 ;
sh:datatype xsd:string ;
sh:maxCount 1 ],
[sh:path <https://w3id.org/kdsf-ffk/092> ;
sh:name "Semiconductor Technology"@de ;
sh:name "Semiconductor Technology"@en ;
sh:order 1 ;
sh:minCount 1 ;
sh:datatype xsd:string ;
sh:description "e.g. SiC, GaN, IGBT"],
[sh:path qb:component ;
sh:name "Gate Driver (Name)"@de ;
sh:name "Gate Driver (Name)"@en ;
sh:order 7 ;
sh:datatype xsd:string],
[sh:path <https://purl.org/coscine/terms/69b0f82a-a677-449c-8e71-7894ff26145b/> ;
sh:name "Gate On Resistance (Ω)"@de ;
sh:name "Gate On Resistance (Ω)"@en ;
sh:order 8 ;
sh:datatype xsd:decimal ;
sh:minInclusive 0 ],
[sh:path <https://purl.org/coscine/terms/48ba611d-2597-4b78-a5db-b53eea8cda19/> ;
sh:name "Gate Off Resistance (Ω)"@de ;
sh:name "Gate Off Resistance (Ω)"@en ;
sh:order 9 ;
sh:datatype xsd:decimal ;
sh:minInclusive 0 ],
[sh:path <https://purl.org/coscine/terms/43d72c75-58a7-48c6-9186-25019ed15d6c/> ;
sh:name "Load Inductance (µH)"@de ;
sh:name "Load Inductance (µH)"@en ;
sh:order 13 ;
sh:datatype xsd:decimal ;
sh:minExclusive 0 ],
[sh:path <https://purl.org/coscine/terms/792b8e82-e31f-4ffb-8418-32b043ad24ea/> ;
sh:name "Measurement Technique (Voltage)"@de ;
sh:name "Measurement Technique (Voltage)"@en ;
sh:order 11 ;
sh:datatype xsd:string ;
sh:defaultValue "Passive Probe"],
[sh:path <https://purl.org/coscine/terms/782849f8-644f-4902-a65b-e75b5a42df1b/> ;
sh:name "Measurement Technique (Current)"@de ;
sh:name "Measurement Technique (Current)"@en ;
sh:order 12 ;
sh:datatype xsd:string ;
sh:defaultValue "Shunt Resistor"].
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